Model-Based Fault Injection for Failure Effect Analysis

نویسندگان

  • Yohei Nakata
  • Yasuhiro Ito
  • Yasuo Sugure
  • Shigeru Oho
  • Yusuke Takeuchi
  • Shunsuke Okumura
  • Hiroshi Kawaguchi
  • Masahiko Yoshimoto
چکیده

We propose a fault-injection system (FIS) that can inject faults such as read/write margin failures and soft errors into a SRAM environment. The fault case generator (FCG) generates time-series SRAM failures in 7T/14T or 6T SRAM, and the proposed device model and fault-injection flow are applicable for system-level verification. For evaluation, an abnormal termination rate in vehicle engine control was adopted. We confirmed that the vehicle engine control system with the 7T/14T SRAM improves system-level dependability compared with the conventional 6T SRAM. Keywordsfault injection; SRAM; system-level verification; dependable processor

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تاریخ انتشار 2011